“Laser-free GHz stroboscopic TEM: construction, deployment, and
benchmarking”

June Lau

NIST, Gaithersburg, MD

Monday, September 14th at 4:00pm

In the previous two decades, important technological advancements have expanded the range of temporal resolution in transmission electron microscopes (TEM). Commercial direct-counting and single-electron detectors have
revealed dynamics in the ms-timescale. Laser-actuated photoemission microscopes [1, 2] combined with beam
scanning, spatially-parsed large area detectors [3], and sparse-sensing algorithms [4], can now unlock phenomena
at the ms to sub-ps timescales. Further optimization of the photoemission stage [5] and beam bunching technologies could extend the temporal resolution into the deep fs-regime. [Read More…]